Recently, the 3-dimensional (3-D) vertical Floating Gate (FG) type NAND flash memory cell arrays with the Extended Sidewall Control Gate (ESCG) was proposed [7]. Using this novel structure, we successfully implemented superior program speed, read current, and less interference characteristics, by the high Control Gate (CG) coupling ratio with less interference capacitance and highly electrical inverted S/D technique. However, the process stability of the ESCG structure has not been sufficiently confirmed such as the variations of the physical dimensions. In this paper, we intensively investigated the electrical dependency according to the physical dimensions of ESCG, such as the line and spacing of ESCG and the thickness of barrier oxide. Using the 2-dimentional (2-D) TCAD simulations, we compared the basic characteristics of the FG type flash cell operation, in the aspect of program speed, read current, and interference effect. Finally, we check the process window and suggest the optimum target of the ESCG structure for reliable flash cell operation. From above all, we confirmed that this 3-dimensional vertical FG NAND flash memory cell arrays using the ESCG structure is the most attractive candidate for terabit 3-D vertical NAND flash cell array.

This paper presents an improvement of the memory cell reliability by the memory cell VTH optimization of the ferroelectric (Fe)-NAND flash memory. The effects of the memory cell VTH on the reliability of the Fe-NAND flash memory are experimentally analyzed for the first time. The reliability is evaluated by the measured VTH shift due to the read disturb, program disturb and data retention. Three types of Fe-NAND flash memory cells, a positive, zero and negative VTH memory cell, are defined on the basis of the memory cell VTH. The middle of VTH of programmed and erased states is 1 V, 0 V and -0.3 V in a positive, zero and negative VTH memory cell, respectively. The VTH shift of the positive, zero and negative VTH memory cells show similar characteristics in the program/erase and the VPASS and VPGM disturbs because the external electric field is so high that the internal depolarization field does not affect the VTH shift. On the other hand, in the data retention, the VTH shift of the three types of VTH memory cells show different characteristics. The reliability of the Fe-NAND flash memory is best optimized in the zero VTH memory cell. In the proposed zero VTH Fe-NAND flash memory cell scheme, the measured VTH shift due to the read disturb, program disturb and data retention decreases by 32%, 24% and 10%, respectively, compared with conventional positive VTH Fe-NAND flash memory cell scheme. Contrarily, in the negative VTH memory cell, the VTH shift during the data retention is 0.49 V and unacceptably large because of the depolarization field. The conventional positive VTH memory cell suffers from a sever read and program disturb. The measured results are drastically different from those of the conventional floating-gate NAND flash memory cell where the negative VTH memory cell is most suitable in terms of the reliability.

In disk-based storage systems, non-volatile write caches have been widely used to reduce write latency as well as to ensure data consistency at the level of a storage controller. Write cache policies should basically consider which data is important to cache and evict, and they should also take into account the real I/O features of a non-volatile device. However, existing work has mainly focused on improving basic cache operations, but has not considered the I/O cost of a non-volatile device properly. In this paper, we propose a pattern-aware write cache policy, PAW for a NAND flash memory in disk-based mobile storage systems. PAW is designed to face a mix of a number of sequential accesses and fewer non-sequential ones in mobile storage systems by redirecting the latter to a NAND flash memory and the former to a disk. In addition, PAW employs the synergistic effect of combining a pattern-aware write cache policy and an I/O clustering-based queuing method to strengthen the sequentiality with the aim of reducing the overall system I/O latency. For evaluations, we have built a practical hard disk simulator with a non-volatile cache of a NAND flash memory. Experimental results show that our policy significantly improves the overall I/O performance by reducing the overhead from a non-volatile cache considerably over a traditional one, achieving a high efficiency in energy consumption.

This letter introduces a buffer management issue in designing SSDs for log-structured file systems (LFSs). We implemented a novel trace-driven SSD simulator in SystemC language, and simulated several SSD architectures with the NILFS2 trace. From the results, we give two major considerations related to the buffer management as follows. (1) The write buffer is used as a buffer not a cache, since all write requests are sequential in NILFS2. (2) For better performance, the main architectural factor is the bus bandwidth, but 332 MHz is enough. Instead, the read buffer makes a key role in performance improvement while caching data. To enhance SSDs, accordingly, it is an effective way to make efficient read buffer management policies, and one of the examples is tracking the valid data zone in NILFS2, which can increase the data hit ratio in read buffers significantly.

The multilevel dual-channel (MLDC) not-AND (NAND) flash memories cell structures with asymmetrically-doped channel regions between the source and the drain were proposed to enhance read and program verifying speeds. The channel structure of the MLDC flash memories consisted of two different doping channel regions. The technical computer aided design simulation results showed that the designed MLDC NAND flash cell with asymmetrically-doped channel regions provided the high-speed multilevel reading with a wider current sensing margin and the high-speed program verifying due to the sensing of the discrete current levels. The proposed unique MLDC NAND flash memory device can be used to increase read and program verifying speed.

In this paper, we present an efficient index structure for NAND flash memory, called the Dynamic Forest (D-Forest). Since write operations incur high overhead on NAND flash memory, D-Forest is designed to minimize write operations for index updates. The experimental results show that D-Forest significantly reduces write operations compared to the conventional B+-tree.

Recently, various types of 3-D nonvolatile memory (NVM) devices have been researched to improve the integration density [1]-[3]. The NVM device of pillar structure can be considered as one of the candidates [4],[5]. When this is applied to a NAND flash memory array, bottom end of the device channel is connected to the bulk silicon. In this case, the current in vertical direction varies depending on the thickness of silicon channel. When the channel is thick, the difference of saturation current levels between on/off states of individual device is more obvious. On the other hand, when the channel is thin, the on/off current increases simultaneously whereas the saturation currents do not differ very much. The reason is that the channel potential barrier seen by drain electrons is lowered by read voltage on the opposite sidewall control gate. This phenomenon that can occur in 3-D structure devices due to proximity can be called gate-induced barrier lowering (GIBL). In this work, the dependence of GIBL on silicon channel thickness is investigated, which will be the criteria in the implementation of reliable ultra-small NVM devices.